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Off-axis tilt compensation in common-path digital holographic microscopy based on hologram rotation

机译:基于全息图旋转的公共路径数字全息显微镜中的轴外倾斜补偿

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摘要

We present a simple and effective compensation method for the off-axis tilt in common-path digital holographic microscopy (CPDHM) by introducing a rotating operation on the hologram. The proposed method mainly requires a digital reference hologram (DRH), which is a rotated version of the original one; it is assumed to be easy to obtain by rotating the specimen's hologram 180 degrees. In this way, the off-axis tilt could be removed by subtracting the retrieved phase of DRH from the retrieved phase of the original hologram, but without any complex spectrum centering judgment, fitting procedures, or prior knowledge of the system. This highly automatic and efficient performance makes our approach available for real-time quantitative phase imaging (QPI), although it limits the field of view (FOV) of the specimen. Some experimental results of microlens array and phase plate demonstrate the feasibility and effectiveness of the proposed method. (C) 2017 Optical Society of America
机译:通过在全息图上引入旋转操作,我们对公共路径数字全息显微镜(CPDHM)中的轴外倾斜提出了一种简单有效的补偿方法。 该方法主要需要数字参考全息图(DRH),这是原始的旋转版本; 假设通过旋转标本的全息图180度来易于获得。 以这种方式,通过从原始全息图的检索阶段减去DRH的检索阶段,可以通过从原始全息图的检索,但没有任何复杂的频谱判定,拟合程序或系统的先验知识来消除轴轴倾斜。 这种高度自动和高效的性能使我们的方法可用于实时定量相位成像(QPI),尽管它限制了样本的视野(FOV)。 微透镜阵列和相板的一些实验结果表明了该方法的可行性和有效性。 (c)2017年光学学会

著录项

  • 来源
    《Optics Letters 》 |2017年第24期| 共4页
  • 作者单位

    Shenzhen Univ Shenzhen Key Lab Micronano Measuring &

    Imaging Bi Key Lab Optoelect Devices &

    Syst Minist Educ &

    Guangdong Prov Shenzhen 518060 Guangdong Peoples R China;

    Ngee Ann Polytech 535 Clementi Rd Singapore 5994892 Singapore;

    Shenzhen Univ Shenzhen Key Lab Micronano Measuring &

    Imaging Bi Key Lab Optoelect Devices &

    Syst Minist Educ &

    Guangdong Prov Shenzhen 518060 Guangdong Peoples R China;

    Shenzhen Univ Shenzhen Key Lab Micronano Measuring &

    Imaging Bi Key Lab Optoelect Devices &

    Syst Minist Educ &

    Guangdong Prov Shenzhen 518060 Guangdong Peoples R China;

    Shenzhen Univ Shenzhen Key Lab Micronano Measuring &

    Imaging Bi Key Lab Optoelect Devices &

    Syst Minist Educ &

    Guangdong Prov Shenzhen 518060 Guangdong Peoples R China;

    Shenzhen Univ Shenzhen Key Lab Micronano Measuring &

    Imaging Bi Key Lab Optoelect Devices &

    Syst Minist Educ &

    Guangdong Prov Shenzhen 518060 Guangdong Peoples R China;

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  • 原文格式 PDF
  • 正文语种 eng
  • 中图分类 计量学 ; 光学 ;
  • 关键词

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