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Characterization of contact resistances in ceramic-coated vertically aligned carbon nanotube arrays

机译:陶瓷涂层垂直对准碳纳米管阵列中接触电阻的表征

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摘要

Despite the technological significance of carbon nanotube (CNT) arrays and metal-oxide coated CNTs for electronic and electrochemical devices such as supercapacitors, lithium-ion batteries, and solar-chemical cells, sub-optimal device performance often results due to large contact resistance between the CNTs and the metallic current collectors or between the CNTs and their ceramic coatings. While contact resistance measurements are regularly carried out on individually contacted CNTs, contact resistance measurements on vertically aligned (VA) CNT arrays are not routine. Here, we demonstrate that two-probe electrical current-voltage measurements and electrochemical impedance spectroscopy can be used to probe the end contact resistance and side contact resistances of coated and uncoated VACNT arrays in order to optimize material deposition and selection.
机译:尽管碳纳米管(CNT)阵列的技术意义(CNT)阵列和金属氧化物涂覆的电子和电化学装置,例如超级电容器,锂离子电池和太阳能化学电池,但是次最优器件性能通常由于较大的接触电阻而导致 CNT和金属集电器或CNT和它们的陶瓷涂层之间。 虽然在单独接触的CNT上定期进行接触电阻测量,但垂直对齐(VA)CNT阵列的接触电阻测量不是常规的。 这里,我们证明了两个探针电流 - 电压测量和电化学阻抗光谱可用于探测涂覆和未涂覆的VACNT阵列的端部接触电阻和侧接触电阻,以优化材料沉积和选择。

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  • 来源
    《RSC Advances 》 |2019年第13期| 共10页
  • 作者单位

    Swiss Fed Inst Technol Dept Mech &

    Proc Engn CH-8092 Zurich Switzerland;

    Swiss Fed Inst Technol Dept Mech &

    Proc Engn CH-8092 Zurich Switzerland;

    Swiss Fed Inst Technol Dept Informat Technol &

    Elect Engn CH-8092 Zurich Switzerland;

    Swiss Fed Inst Technol Dept Mech &

    Proc Engn CH-8092 Zurich Switzerland;

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  • 原文格式 PDF
  • 正文语种 eng
  • 中图分类 化学 ;
  • 关键词

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