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Impact of pH and temperature on the electrochemical and semiconducting properties of zinc in alkaline buffer media

机译:pH与温度对碱性缓冲介质锌电化学和半导体性能的影响

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摘要

The electrochemical and semiconductive properties of spontaneously formed passive films on pure Zn were investigated in alkaline carbonate/bicarbonate buffer solutions as functions of pH and temperature. The study was performed in 0.1 M (CO32- + HCO3-) mixtures over the pH range 9.2 to 9.8 using open circuit potential, electrochemical impedance spectroscopy (EIS), potentiodynamic polarization and Mott-Schottky analysis techniques. Generally, zinc passivation is enhanced with either increasing pH or decreasing the ambient temperature. The steady state potential (E-ss) value reveals that in pH 9.8 buffer the propensity of Zn for passivation is superior when compared with those in the other tested buffer solutions. The total surface film resistance (R-t) derived from the impedance data proves this result, which is likely attributed to changes in composition and/or microstructure of the film. In pH 9.8 buffer solution the passivation tendency always decreases with temperature increase. However, in pH 9.2 the system behaves similarly up to 25 degrees C; afterwards zinc passivation trend was found to re-increase once more. The apparent activation energy for the corrosion process was evaluated and discussed. Analysis of Mott-Schottky plots was found to be suitable for characterizing the semiconductor properties of the naturally deposited barrier layers which are all consistent with the well-known n-type character of the oxide film on zinc. The absence of any evidences for the p-type semiconductive behavior indicates a preponderance of oxygen vacancies and zinc interstitials over metal vacancies. Moreover, Mott-Schottky results demonstrate that the donor concentration increases with either increasing pH or deceasing temperature commensurate with the increasing trends in the passive film thickness.
机译:在碱性碳酸盐/碳酸氢盐缓冲溶液中研究了自发形成的无源膜的电化学和半导电性能作为pH和温度的函数。使用开路电位,电化学阻抗谱(EIS),电位极化和MOTT-SCHOTTKY分析技术,在0.1M(CO32- + HCO3-)混合物中在0.1M(CO32- + HCO3-)混合物中进行。通常,通过增加pH或降低环境温度来增强锌钝化。稳态电位(E-SS)值表明,在pH9.8缓冲液中,与其他测试缓冲溶液中的那些相比,缓冲液在钝化的倾向上优越。源自阻抗数据的总表面膜阻力(R-T)证明了该结果,其可能归因于膜的组成和/或微观结构的变化。在pH9.8缓冲溶液中,钝化趋势总是随温度升高而降低。但是,在pH 9.2中,系统的行为行为高达25℃;然后发现锌钝化趋势再次重新增加。评估并讨论了腐蚀过程的表观激活能量。发现Mott-肖特基图的分析适用于表征天然沉积的阻挡层的半导体性质,其全部与锌上的氧化膜的众所周知的n型特征一致。没有任何对p型半导体行为的证据表明氧空缺和金属缺点的锌空洞的优势。此外,Mott-Schottky结果表明供体浓度随着与被动膜厚度的增加趋势的增加而增加,随着pH或死亡温度的增加。

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  • 来源
    《RSC Advances》 |2018年第7期|共12页
  • 作者单位

    Cairo Univ Fac Sci Chem Dept Giza 12613 Egypt;

    Ain Shams Univ Fac Women Arts Sci &

    Educ Cairo 11566 Egypt;

    Ain Shams Univ Fac Women Arts Sci &

    Educ Cairo 11566 Egypt;

    Ain Shams Univ Fac Women Arts Sci &

    Educ Cairo 11566 Egypt;

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  • 原文格式 PDF
  • 正文语种 eng
  • 中图分类 化学;
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