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InGaAs-GaAs Nanowire Avalanche Photodiodes Toward Single-Photon Detection in Free-Running Mode

机译:Ingaas-GaAs纳米线雪崩光电二极管在自由运行模式下朝着单光子检测

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Single-photon detection at near-infrared (NIR) wavelengths is critical for light detection and ranging (LiDAR) systems used in imaging technologies such as autonomous vehicle trackers and atmospheric remote sensing. Portable, high-performance LiDAR relies on silicon-based single-photon avalanche diodes (SPADs) because of their extremely low dark count rate (DCR) and afterpulsing probability, but their operation wavelengths are typically limited up to 905 nm. Although InGaAs-InP SPADs offer an alternative platform to extend the operation wavelengths to eye-safe ranges, their high DCR and afterpulsing severely limit their commercial applications. Here we propose a new separate absorption and multiplication avalanche photodiode (SAM-APD) platform composed of vertical InGaAs-GaAs nanowire arrays for single-photon detection. Among a total of 4400 nanowires constituting one photodiode, each avalanche event is confined in a single nanowire, which means that the avalanche volume and the number of filled traps can be drastically reduced in our approach. This leads to an extremely small afterpulsing probability compared with conventional InGaAs-based SPADs and enables operation in free-running mode. We show a DCR below 10 Hz, due to reduced fill factor, with photon count rates of 7.8 MHz and timing jitter less than 113 ps, which suggest that nanowire-based NIR focal plane arrays for single-photon detection can be designed without active quenching circuitry that severely restricts pixel density and portability in NIR commercial SPADs. Therefore, the proposed work based on vertical nanowires provides a new degree of freedom in designing avalanche photodetectors and could be a stepping stone for high-performance InGaAs SPADs.
机译:近红外线(NIR)波长的单光子检测对于用于诸如自主车辆跟踪器和大气遥感的成像技术中使用的光检测和测距(LIDAR)系统至关重要。便携式的高性能激光雷达依赖于基于硅的单光子雪崩二极管(SPAD),因为它们极低的暗计数率(DCR)和后脉冲概率,但它们的操作波长通常限制高达905nm。虽然IngaAs-InP Spad提供替代平台,但是将操作波长扩展到眼睛安全范围,它们的高DCR和后脉冲严重限制了其商业应用。在这里,我们提出了一种新的单独吸收和乘法雪崩光电二极管(SAM-APD)平台,其由垂直InGaAs-GaAs纳米线阵列组成,用于单光子检测。在构成一个光电二极管的总共4400个纳米线中,每个雪崩事件被限制在单个纳米线中,这意味着在我们的方法中可以大大降低雪崩体积和填充陷阱的数量。与传统的基于InGaAs的侧面相比,这导致了极小的后脉冲概率,并且能够以自由运行模式运行。我们在低于10 Hz以下的DCR,由于填充因子降低,光子计数为7.8MHz和时序抖动小于113 PS,这表明可以设计用于单光子检测的基于纳米射焦平面阵列,而无需主动淬火就可以设计严重限制NIR商业壳中的像素密度和便携性的电路。因此,基于垂直纳米线的拟议工作在设计雪崩光电探测器时提供了一种新的自由度,并且可以是高性能Ingaas Spad的垫脚石。

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