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Novo&Stitch: accurate reconciliation of genome assemblies via optical maps

机译:Novo&缝合:通过光学图准确地对齐

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Motivation: De novo genome assembly is a challenging computational problem due to the high repetitive content of eukaryotic genomes and the imperfections of sequencing technologies (i.e. sequencing errors, uneven sequencing coverage and chimeric reads). Several assembly tools are currently available, each of which has strengths and weaknesses in dealing with the trade-off between maximizing contiguity and minimizing assembly errors (e.g. mis-joins). To obtain the best possible assembly, it is common practice to generate multiple assemblies from several assemblers and/or parameter settings and try to identify the highest quality assembly. Unfortunately, often there is no assembly that both maximizes contiguity and minimizes assembly errors, so one has to compromise one for the other.
机译:动机:De Novo基因组组件是一种挑战性的计算问题,由于真核基因组的高重复含量和测序技术的缺陷(即测序误差,不均匀测序覆盖和嵌合读数)。 目前有几种装配工具,每个装配工具都具有在最大化邻接和最小化装配误差(例如MIS-JOIN)之间处理折衷之间的优势和缺点。 为了获得最佳的组装,通常做法是从多个汇编程序和/或参数设置生成多个程序集,并尝试识别最高质量的组件。 不幸的是,通常没有组装,两者都可以最大化邻接并最大限度地减少装配错误,因此一个人必须为另一个妥协一个。

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