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首页> 外文期刊>Electrochimica Acta >Electron transport determines the electrochemical properties of tetrahedral amorphous carbon (ta-C) thin films
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Electron transport determines the electrochemical properties of tetrahedral amorphous carbon (ta-C) thin films

机译:电子传输确定四面体非晶碳(TA-C)薄膜的电化学性质

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摘要

Amorphous carbon based electrodes are very promising for electrochemical sensing applications. In order to better understand their structure-function relationship, the effect of film thickness on the electrochemical properties of tetrahedral amorphous carbon (ta-C) electrodes was investigated. ta-C thin films of 7, 15, 30, 50 and 100 nm were characterized in detail with Raman spectroscopy, transmission electron microscopy (TEM), conductive atomic force microscopy (c-AFM), scanning tunneling spectroscopy (STS) and X-ray absorption spectroscopy (XAS) to assess (i) the surface properties of the films, (ii) the effect of film thickness on their structure and electrical properties and (iii) the subsequent correlation with their electrochemistry. The electrochemical properties were investigated by cyclic voltammetry (CV) using two different outer-sphere redox probes, Ru(NH3)(6)(3+/2+) and FcMeOH, and by electrochemical impedance spectroscopy (EIS). Computational simulations using density functional theory (DFT) were carried out to rationalize the experimental findings. The characterization results showed that the sp(2)/sp(3) ratio increased with decreasing ta-C film thickness. This correlated with a decrease in mobility gap value and an increase in the average current through the films, which was also consistent with the computational results. XAS indicated that the surface of the ta-C films was always identical and composed of a sp(2)-rich layer. The CV measurements indicated reversible reaction kinetics for both outer-sphere redox probes at 7 and 15 nm ta-C films with a change to quasi-reversible behavior at a thickness of around 30 nm. The charge transfer resistance, obtained from EIS measurements, decreased with decreasing film thickness in accordance with the CV results. Based on the characterization and electrochemical results, we conclude that the reaction kinetics in the case of outer-sphere redox systems is determined mainly by the electron transport through the films and not the electron transfer between the redox probe and the electrode surface, since the surface region is expected to be identical in all the ta-C films. Finally, it was shown that a titanium interlayer between the Si substrate and ta-C significantly affected the electrical and electrochemical properties of the electrodes, further emphasizing the role of electron transport through the film in determining the electrochemical behavior of ta-C. (C) 2016 Elsevier Ltd. All rights reserved.
机译:非晶碳基电极对于电化学传感应用非常有前途。为了更好地了解它们的结构功能关系,研究了膜厚度对四面体非晶碳(TA-C)电极电化学性质的影响。用拉曼光谱法,透射电子显微镜(TEM),导电原子力显微镜(C-AFM),扫描隧道光谱(STS)和X-详细表征7,5,30,50和100nm的Ta-C薄膜。射线吸收光谱(XAS)评估(I)薄膜的表面性质,(ii)膜厚度对其结构和电性能的影响和(iii)随后与其电化学的相关性。使用两种不同的外球氧化还原探针,Ru(NH 3)(6)(3 + / 2 +)和FCMEOH,并通过电化学阻抗光谱(EIS)来研究通过环状伏安法(CV)研究电化学性质。使用密度泛函理论(DFT)进行计算模拟以合理化实验结果。表征结果表明,SP(2)/ SP(3)比随着TA-C膜厚度的降低而增加。这与迁移间隙值的降低和通过膜的平均电流的增加相关,这也与计算结果一致。 Xas表示,TA-C膜的表面始终相同并由SP(2) - rich层组成。 CV测量表明,在7和15nm Ta-C膜上的外球氧化还原探针的可逆反应动力学,其厚度为约30nm的准可逆行为。从EIS测量中获得的电荷传递电阻随着CV结果而降低膜厚度而降低。基于表征和电化学结果,我们得出结论,外球氧化还原系统的反应动力学主要由电子传输通过膜而不是氧化还原探针和电极表面之间的电子传递来确定。预计地区在所有TA-C电影中会相同。最后,显示Si衬底和TA-C之间的钛中间层显着影响电极的电化学和电化学特性,进一步强调电子传输通过薄膜的作用确定Ta-C的电化学行为。 (c)2016 Elsevier有限公司保留所有权利。

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