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首页> 外文期刊>International Journal of Modern Physics, B. Condensed Matter Physics, Statistical Physics, Applied Physics >The dependence of critical current density of GdFeCo layer on composition of thermally assisted STT-RAM
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The dependence of critical current density of GdFeCo layer on composition of thermally assisted STT-RAM

机译:GDFECO层临界电流密度对热辅助STT-RAM组成的依赖性

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Amorphous rare earth transitional metal (RETM) GdFeCo memory layer with RE and TM-rich compositions was fabricated in stacks of GdFeCo (10 nm)/Cu (3 nm)/[Co(0.2 nm)/Pd(0.4 nm)](6). Their magnetic properties and spin transfer torque (STT) switching of magnetization were investigated. The maximum magneto-resistance (MR) was around 0.24% for the TM-rich Gd-21.4 (Fe90Co10)(78.6) memory layer and was 0.03% for the RE-rich Gd-29.0 (Fe90Co10.)(71.0) memory layer. The critical current densities J(c) to switch the GdFeCo memory layers are in the range of 1.4 x 107 A/cm(2)-4.5 x 10(7) A/cm(2). The dependence of critical current density J(c) and effective anisotropy constant K-eff on Gd composition were also investigated. Both J(c), and Keff have maximum values in the Gd composition range from 21-29 at.%, suitable for thermally assisted STT-RAM for storage density exceeding Gb/inch(2).
机译:非晶稀土过渡金属(RETM)与RE和TM的组合物的GDFECO记忆层在GDFECO(10nM)/ Cu(3nM)/ [CO(0.2nm)/ Pd(0.4nm)]堆中制造(6 )。 研究了它们的磁性和旋转转移扭矩(STT)切换磁化。 最大磁阻(MR)为TM富含GD-21.4(FE90CO10)(Fe90CO10)(78.6)记忆层的0.24%约为0.24%,并且为重新富含GD-29.0(Fe90Co10)(71.0)记忆层为0.03%。 切换GDFECO存储器层的临界电流密度J(C)的临界电流密度J(C)的范围为1.4×107a / cm(2)-4.5×10(7)A / cm(2)。 还研究了临界电流密度J(C)和有效各向异性常数K-EFF对GD组合物的依赖性。 j(c)和Keff均在GD组合物中具有21-29的最大值。%,适用于用于储存密度超过GB /英寸(2)的热辅助STT-RAM。

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