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Two-Dimensional Layered Semiconductor Tungsten Disulfide and Molybdenum-Tungsten Disulfide: Synthesis, Materials Properties and Electronic Structure

机译:二维层状半导体二硫化钨和钼钨二硫化物:合成,材料性能和电子结构

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摘要

Atomically thin two-dimensional tungsten disulfide layers have been synthesized on silicon dioxide substrates via chemical vapor deposition with the assistance of hydrothermally synthesized tungsten trioxide seeds. This seed-assisted chemical vapor deposition approach allows production of highly crystalline semiconductor tungsten disulfide layers with a band gap of 1.94 eV in monolayer form. Photoluminescence spectroscopy measurements in conjunction with ab-initio density functional theory calculations show that bulk tungsten disulfide undergoes a transition from an indirect band gap to a direct one in monolayer limit. We have also synthesized heterogeneous systems of molybdenum disulfide and tungsten disulfide and characterized the layers by Raman and Photoluminescence spectroscopy measurements. The density functional theory calculations verify the modification of the band gap by changing the composition of molybdenum and tungsten in molybdenum-tungsten disulfide heterogeneous layers, pointing to creating a range of band gap values by alloying two-dimensional semiconductors.
机译:在水热合成的三氧化钨晶种的辅助下,通过化学气相沉积法在二氧化硅衬底上合成了原子薄的二维二硫化钨层。这种种子辅助化学气相沉积方法允许以单层形式生产带隙为1.94 eV的高度结晶的半导体二硫化钨层。结合从头算密度函数理论计算得出的光致发光光谱测量结果表明,块状二硫化钨经历了从间接带隙到单层极限的直接带隙的跃迁。我们还合成了二硫化钼和二硫化钨的异质体系,并通过拉曼光谱和光致发光光谱法对层进行了表征。密度泛函理论计算通过改变钼-钨-二硫化钨异质层中的钼和钨的组成,验证了带隙的改变,指出通过使二维半导体合金化来创建一定范围的带隙值。

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