首页> 外文期刊>Journal of nanoscience and nanotechnology >Effect of the ZnS Shell Layer on the Electrical Properties of Organic Bistable Devices Fabricated Utilizing CdSe/CdS/ZnS Core-Shell-Shell Quantum Dots Embedded in a Poly(methylmethacrylate) Layer
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Effect of the ZnS Shell Layer on the Electrical Properties of Organic Bistable Devices Fabricated Utilizing CdSe/CdS/ZnS Core-Shell-Shell Quantum Dots Embedded in a Poly(methylmethacrylate) Layer

机译:ZnS壳层对利用嵌入甲基丙烯酸甲酯层中的CdSe / CdS / ZnS核-壳-壳量子点制造的有机双稳态器件电学性能的影响

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摘要

X-ray photoelectron spectroscopy spectra showed that the synthesized elements of the CdSe/CdS/ZnS QDs were Cd, Se, Zn, and S. Organic bistable devices (OBDs) containing CdSe/CdS/ZnS quantum dots (QDs) and a poly(methylmethacrylate) (PMMA) layer were fabricated on indiumtin-oxide (ITO)-deposited glass substrates. Current-voltage (I-V) curves showed that the memory margin of the Al/(CdSe/CdS/ZnS QDs) embedded in PMMA layer/ITO device at 300 K was larger than that of the device without a ZnS shell layer. The retention time of the OBDs was above 1x10(4) s, indicative of the stability of the device. The memory mechanisms were described by using charge trapping and tunneling processes on the basis of the energy diagram and the I-V curves.
机译:X射线光电子能谱显示CdSe / CdS / ZnS量子点的合成元素是Cd,Se,Zn和S.有机双稳态器件(OBDs)包含CdSe / CdS / ZnS量子点(QDs)和聚在沉积氧化铟锡(ITO)的玻璃基板上制造(PMMA)层。电流-电压(I-V)曲线表明,在300 K下嵌入PMMA层/ ITO器件中的Al /(CdSe / CdS / ZnS QDs)的存储裕度大于没有ZnS壳层的器件的存储裕度。 OBD的保留时间超过1x10(4)s,表明设备的稳定性。在能量图和IV曲线的基础上,通过电荷捕获和隧穿过程描述了存储机制。

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