首页> 外文期刊>Journal of Materials Science >Microstructure evolution and hardness variation during annealing of equal channel angular pressed ultra-fine grained nickel subjected to 12 passes
【24h】

Microstructure evolution and hardness variation during annealing of equal channel angular pressed ultra-fine grained nickel subjected to 12 passes

机译:等通道角挤压超细晶镍退火12次时的组织演变和硬度变化

获取原文
获取原文并翻译 | 示例
获取外文期刊封面目录资料

摘要

The microstructure, thermal stability and hardness of ultra-fine grained (UFG) Ni produced by 12 passes of equal channel angular pressing (ECAP) through the route Bc were studied. Comparing the microstructure and hardness of the as-ECAPed samples with the published data on UFG Ni obtained after 8 passes of ECAP through the route Bc reveals a smaller average grain size (230 nm in the present case compared with 270 nm in 8-pass Ni), significantly lower dislocation density (1.08 × 10~(14) m-~(2)compared with 9 × 10~(14) m~(-2) in 8-pass Ni) and lower hardness (2 GPa compared with 2.45 GPa for 8-pass Ni). Study of the thermal stability of the 12-pass UFG Ni revealed that recovery is dominant in the temperature range 150-250°C and recrystallisation occurred at temperatures >250 °C. The UFG microstructure is relatively stable up to about 400 °C. Due to the lower dislocation density and consequently a lower stored energy, the recrystallisation of 12-pass ECAP Ni occurred at a higher temperature (~250 °C) compared with the 8-pass Ni (~200 °C). In the 12-pass Nickel, hardness variation shows that its dependence on grain size is inversely linear rather than the common grain size-0.5 dependence.
机译:研究了通过等通道角挤压(ECAP)通过路径Bc的12次通过所产生的超细颗粒镍(UFG)的微观结构,热稳定性和硬度。将经ECAP处理的样品的显微结构和硬度与ECAP经过8次通过Bc通道后获得的关于UFG Ni的公开数据进行比较,发现平均晶粒尺寸较小(当前为230 nm,而8遍Ni为270 nm) ),位错密度显着降低(1.08×10〜(14)m-〜(2),而8道次Ni中为9×10〜(14)m〜(-2))和较低的硬度(2 GPa与2.45比较8次Ni的GPa)。对12遍UFG Ni的热稳定性的研究表明,在150-250°C的温度范围内,回收率占主导地位,并且在> 250°C的温度下发生重结晶。 UFG的微结构在大约400°C的温度下相对稳定。由于较低的位错密度和较低的存储能量,与8道次Ni(〜200°C)相比,12道次ECAP Ni的重结晶发生在更高的温度(〜250°C)下。在12道次镍中,硬度变化表明其对晶粒尺寸的依赖性呈反线性关系,而不是普通晶粒尺寸的0.5依赖性。

著录项

相似文献

  • 外文文献
  • 中文文献
  • 专利
获取原文

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号