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首页> 外文期刊>Journal of Alloys and Compounds: An Interdisciplinary Journal of Materials Science and Solid-state Chemistry and Physics >Synthesis of high Al content Al_xGa_(1-x)N ternary films by pulsed laser co-ablation of GaAs and Al targets assisted by nitrogen plasma
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Synthesis of high Al content Al_xGa_(1-x)N ternary films by pulsed laser co-ablation of GaAs and Al targets assisted by nitrogen plasma

机译:氮等离子体辅助GaAs和Al靶的脉冲激光共烧蚀合成高Al含量的Al_xGa_(1-x)N三元膜

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摘要

We present the synthesis of Al_xGa_(1-x)N ternary films by pulsed laser co-ablation of a polycrystalline GaAs target and a metallic Al target in the environment of nitrogen plasma which provides nitrogen for the films and assists the formation of nitride films. Field emission scanning electron microscopy exposes the smooth surface appearance and dense film structure. X-ray diffraction, Fourier-transform infrared spectroscopy and Raman scattering spectroscopy reveal the hexagonal wurtzite structure. Optical characterization shows high optical transmittance with an absorption edge of about 260 nm and a band gap of 4.7 eV. Compositional analysis gives the Al content of about 0.6. The structure and optical properties of the Al_xGa_(1-x)N films are compared with those of binary GaN and A1N films synthesized by ablating GaAs or Al target with the same nitrogen plasma assistance.
机译:我们提出了在氮等离子体的环境中通过脉冲激光共烧多晶GaAs靶和金属Al靶来合成Al_xGa_(1-x)N三元膜的方法,该氮等离子体为膜提供了氮并有助于形成氮化膜。场发射扫描电子显微镜显示出光滑的表面外观和致密的膜结构。 X射线衍射,傅立叶变换红外光谱和拉曼散射光谱揭示了六方纤锌矿结构。光学表征显示出高的光学透射率,吸收边缘约为260 nm,带隙为4.7 eV。成分分析得出Al含量约为0.6。将Al_xGa_(1-x)N薄膜的结构和光学性质与通过在相同氮等离子体辅助下烧蚀GaAs或Al靶而合成的二元GaN和AlN薄膜进行比较。

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