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首页> 外文期刊>Journal of Alloys and Compounds: An Interdisciplinary Journal of Materials Science and Solid-state Chemistry and Physics >A mechanically switchable metal-insulator transition in Mg_2NiH_4 discovers a strain sensitive, nanoscale modulated resistivity connected to a stacking fault
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A mechanically switchable metal-insulator transition in Mg_2NiH_4 discovers a strain sensitive, nanoscale modulated resistivity connected to a stacking fault

机译:Mg_2NiH_4中的机械可切换的金属-绝缘体过渡层发现了与堆垛层错相关的应变敏感,纳米级调制电阻率

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摘要

The band gap in semiconducting Mg_2NiH_4 was found to be dependent on subtle structural differences. This was discovered when investigating if thin film samples of Mg_2NiH_4 could be used in a switchable mirror or window device by utilizing a high to low temperature transition at about 510 K. In powder samples; this transition between an FCC high temperature phase, with dynamically disordered NiH4-complexes, and a monoclinic distorted low temperature phase, with ordered Mg_2NiH_4-complexes, has been demonstrated in a mechanical reversible conductor-insulator transition (Blomqvist and Noreus (2002) [7]). Black monoclinic Mg_2NiH_4 powders were found to have a band gap of 1.1 eV. Pressed tablets of black monoclinic Mg_2NiH_4 powders are conductive, probably from doping by impurities or non-stoichiometry. Thin film Mg_2NiH_4 samples were produced by reacting hydrogen with magnetron sputtered Mg_2Ni films on quartz glass or CaF_2 substrates. The Mg_2NiH_4 films on the other hand were orange, transparent with a band gap of 2.2 eV and a cubic unit cell parameter almost identical to the disorder HT phase but with lower symmetry. If black Mg_2NiH_4 powder is heated above the phase transition at 510 K and subsequently cooled down, the conductivity is lost and the powder turns brown. After this heat treatment TEM pictures revealed a multiple stacking fault having a local pseudo-cubic arrangement separating regions of monoclinic symmetry. The loss of conductivity and colour change is attributed to a higher band gap in the strained areas. The structure on each side of the stacking fault is related by a mirror plane as a consequence of the possibility for the NiH_4-complexes to order with different orientations. This leads to a mismatch in the long range ordering and strain is probably creating the stacking faults. Strain is important for forming the cubic modification. A severely strained film was revealed with optical microscopy in reflected light, indicating that strain prevents it from relaxing back into the monoclinic structure. This was supported by multiple twinned red translucent Mg_2NiH_4 crystals grown with cubic symmetry at elevated temperatures in a LiH flux. When cooled to ambient conditions, the "crystals" had the same cubic symmetry as the films, probably held together by their neighbours. When they were ground to a fine powder to prepare TEM samples, they relaxed and reverted back to the conventional monoclinic unit cell. This interesting nanoscale modulated resistance could possibly be developed into novel memory devices if properly controllable.
机译:发现半导体Mg_2NiH_4中的带隙取决于微妙的结构差异。这是在研究Mg_2NiH_4薄膜样品是否可以通过利用约510 K的高温到低温转变而用于可切换反射镜或窗户装置中时发现的。在机械可逆的导体-​​绝缘体过渡过程中,已经证明了FCC高温相具有动态无序的NiH4复合物与单斜畸变的低温相具有有序的Mg_2NiH_4-复合物之间的过渡(Blomqvist和Noreus(2002)[7] ])。发现黑色单斜晶Mg_2NiH_4粉末的带隙为1.1 eV。黑色单斜晶Mg_2NiH_4粉末的压制片具有导电性,可能是由于杂质或非化学计量的掺杂。通过使氢与磁控溅射石英玻璃或CaF_2衬底上的Mg_2Ni薄膜反应,制得薄膜Mg_2NiH_4样品。另一方面,Mg_2NiH_4膜为橙色,透明,带隙为2.2 eV,立方晶胞参数几乎与无序HT相相同,但对称性较低。如果将黑色的Mg_2NiH_4粉末在510 K处加热至相变以上并随后冷却,则会失去导电性,并且粉末变为棕色。在此热处理之后,TEM照片显示出多处堆垛层错,其局部伪立方排列将单斜对称区域分开。电导率和颜色变化的损失归因于应变区域中较高的带隙。由于NiH_4-络合物可能以不同的方向排列,因此堆垛层错两侧的结构与镜面有关。这会导致远距离排序不匹配,并且应变可能会造成堆垛层错。应变对于形成三次修改很重要。用光学显微镜在反射光下发现了严重变形的薄膜,这表明应变阻止了薄膜松弛回到单斜结构中。这由在LiH助熔剂中在高温下以立方对称生长的多个孪晶红色半透明Mg_2NiH_4晶体支持。当冷却到环境条件时,“晶体”具有与薄膜相同的立方对称性,可能是由它们的邻居将它们粘合在一起的。当将它们研磨成细粉以制备TEM样品时,它们会放松并恢复为常规的单斜晶胞。如果适当控制的话,这种有趣的纳米级调制电阻可能会发展成新颖的存储设备。

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