Atomic Force Microscopy and Contact Angle Studies of Polymerizable Gemini Surfactant Admicelles on Mica

摘要

Atomic force microscopy (AFM) was used todirectly observe and characterize a polymer-modified micasurface prepared using a polymerizable gemini surfactant.Normal tapping mode and contact mode AFM were used toimage the treated mica surface morphologies in air and liq-uid environments, respectively. The root mean square (RMS)roughness of mica surfaces before and after surface modifica-tion and polymerization was analyzed from these scans. Todetermine the effect of styrene adsolubilization on the surfac-tant-modified mica, AFM measurements of the modifiedmica were made at various styrene concentrations. Contact angle measurements were also made to further characterizethe nature of the surfactant-modified mica surface. The sur-face morphology and surface hydrophilicity were observedto be different for the modified mica after polymerization. Inaddition, the polymerized surface maintained its morphol-ogy after washing/desorption studies demonstrating the sta-bility of the polymerized surfactant film.