首页> 外文期刊>The journal of physical chemistry, C. Nanomaterials and interfaces >Large Scale Assembly of Pristine Semiconducting Carbon Nanotube Network-Based Devices Exhibiting Intrinsic Characteristics
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Large Scale Assembly of Pristine Semiconducting Carbon Nanotube Network-Based Devices Exhibiting Intrinsic Characteristics

机译:具有本质特征的基于原始半导体碳纳米管网络的器件的大规模组装

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摘要

We report the large-scale fabrication of high-performance field effect transistors (FETs) based on pristine semiconducting single-walled carbon nanotube (s-SWCNT) networks without bundles or organic impurities, thus exhibiting its intrinsic characteristics. Here, the solution of pristine s-SWCNTs without bundles or organic impurities was prepared in nonpolar solvent via filtration and centrifugation processes, and the s-SWCNTs in the solution were selectively assembled onto specific regions on the solid substrates via a directed assembly strategy. The fabricated FET devices based on such pristine s-SWCNT networks could exhibit a rather large on-oft ratio up to over ~10~6 and a subthreshold swing as small as ~490 mV/dec, which are comparable to those of a single s-SWCNT-bascd device with the same device structure. Importantly, the s-SWCNT devices exhibited anomalous gating behaviors such as an on-current saturation at a large gate bias and unconventional scaling behaviors, which are quite different from those of previous SWCNT network-based devices. Such anomalous behaviors can be explained by a simple model based on the networks of contact and CNT resistances, which implies that the anomalous behaviors are, in fact, the intrinsic characteristics of pristine s-SWCNT network-based devices. Our work provides a new insight about the intrinsic characteristics of pristine s-SWCNT network-based devices and, thus, should be an important guideline for the future research and applications of high-performance s-SWCNT network-based devices.
机译:我们报告了基于原始半导体单壁碳纳米管(s-SWCNT)网络而没有束或有机杂质的高性能场效应晶体管(FET)的大规模制造,从而展现出其固有特性。在此,通过过滤和离心过程在非极性溶剂中制备了没有束或有机杂质的原始s-SWCNT溶液,并通过定向组装策略将溶液中的s-SWCNT选择性地组装到了固体基质的特定区域上。基于这样的原始s-SWCNT网络制造的FET器件可能显示出相当高的导通比,高达〜10〜6以上,并且亚阈值摆幅小至〜490 mV / dec,这与单个s-SWCNT网络相当。 -SWCNT-bascd设备具有相同的设备结构。重要的是,s-SWCNT器件表现出异常的门控行为,例如在大的栅极偏置下的导通电流饱和和非常规的缩放行为,这与以前的基于SWCNT网络的器件完全不同。可以通过基于接触和CNT电阻网络的简单模型来解释这种异常行为,这意味着该异常行为实际上是基于s-SWCNT网络的原始设备的固有特性。我们的工作为基于s-SWCNT网络的原始设备的内在特性提供了新的见识,因此,它应该成为高性能s-SWCNT网络设备的未来研究和应用的重要指南。

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