...
首页> 外文期刊>The journal of physical chemistry, C. Nanomaterials and interfaces >Correlation between Crystallinity, Charge Transport, and Electrical Stability in an Ambipolar Polymer Field-Effect Transistor Based on Poly(naphthalene-alt-diketopyrrolopyrrole)
【24h】

Correlation between Crystallinity, Charge Transport, and Electrical Stability in an Ambipolar Polymer Field-Effect Transistor Based on Poly(naphthalene-alt-diketopyrrolopyrrole)

机译:基于聚萘二甲酸丙二酮吡咯并吡咯的双极性聚合物场效应晶体管的结晶度,电荷传输和电稳定性之间的关系

获取原文
获取原文并翻译 | 示例
   

获取外文期刊封面封底 >>

       

摘要

We characterized the electrical properties of ambipolar polymer field-effect transistors (PFETs) based on the low-band-gap polymer, pNAPDO-DPP-EH. The polymer consisted of electron-rich 2,6-di(thienyl)naphthalene units with decyloxy chains (NAPDO) and electron-deficient diketopyrrolo-pyrrole units with 2-ethylhexyl chains (DPP-EH). The as-spun pNAPDO-DPP-EH PFET device exhibited ambipolar transport properties with a hole mobility of 3.64 X 10~(-3) cm~2/(V s) and an electron mobility of 0.37 X 10~(-3) cm~2/(Vs). Thermal annealing of the polymer film resulted in a dramatic increase in the carrier mobility. Annealing at 200 °C yielded hole and electron mobilities of 0.078 and 0.002 cm~2/(V s), respectively. The mechanism by which the mobility had improved was investigated via grazing incidence X-ray diffraction studies, atomic force microscopy, and temperature-dependent transport measurements. These results indicated that thermal annealing improved the polymer film crystallinity and promoted the formation of a longer-range lamellar structure that lowered the thermal activation energy for charge hopping. Thermal annealing, moreover, reduced charge trapping in the films and thus improved the electrical stability of the PFET device. This work underscores the fact that long-range ordering in a crystalline polymer is of great importance for efficient charge transport and high electrical stability.
机译:我们对基于低带隙聚合物pNAPDO-DPP-EH的双极性聚合物场效应晶体管(PFET)的电性能进行了表征。该聚合物由具有十烷氧基链的富电子2,6-二(噻吩基)萘单元(NAPDO)和具有2-乙基己基链的缺电子二酮吡咯并吡咯单元(DPP-EH)组成。初生pNAPDO-DPP-EH PFET器件具有双极性传输特性,空穴迁移率为3.64 X 10〜(-3)cm〜2 /(V s),电子迁移率为0.37 X 10〜(-3)cm 〜2 /(Vs)。聚合物膜的热退火导致载流子迁移率显着增加。在200°C退火时,空穴迁移率和电子迁移率分别为0.078和0.002 cm〜2 /(V s)。通过掠入射X射线衍射研究,原子力显微镜和温度依赖性传输测量研究了提高迁移率的机理。这些结果表明,热退火改善了聚合物膜的结晶度并促进了长范围层状结构的形成,从而降低了电荷跳跃的热活化能。此外,热退火减少了薄膜中的电荷俘获,从而改善了PFET器件的电稳定性。这项工作强调了这样一个事实,即结晶聚合物中的长程有序化对于有效的电荷传输和高的电稳定性至关重要。

著录项

相似文献

  • 外文文献
  • 中文文献
  • 专利
获取原文

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号