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Retrieval of complex chi((2)) parts for quantitative analysis of sum-frequency generation intensity spectra

机译:检索复杂的chi((2))部分以对和频生成强度谱进行定量分析

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Vibrational sum-frequency generation (SFG) spectroscopy has become an established technique for in situ surface analysis. While spectral recording procedures and hardware have been optimized, unique data analysis routines have yet to be established. The SFG intensity is related to probing geometries and properties of the system under investigation such as the absolute square of the second-order susceptibility vertical bar chi((2))vertical bar(2). A conventional SFG intensity measurement does not grant access to the complex parts of chi((2)) unless further assumptions have been made. It is therefore difficult, sometimes impossible, to establish a unique fitting solution for SFG intensity spectra. Recently, interferometric phase-sensitive SFG or heterodyne detection methods have been introduced to measure real and imaginary parts of chi((2)) experimentally. Here, we demonstrate that iterative phase-matching between complex spectra retrieved from maximum entropy method analysis and fitting of intensity SFG spectra (iMEMfit) leads to a unique solution for the complex parts of chi((2)) and enables quantitative analysis of SFG intensity spectra. A comparison between complex parts retrieved by iMEMfit applied to intensity spectra and phase sensitive experimental data shows excellent agreement between the two methods. (C) 2015 AIP Publishing LLC.
机译:振动和频生成(SFG)光谱已成为原位表面分析的一项成熟技术。尽管光谱记录程序和硬件已得到优化,但尚未建立独特的数据分析例程。 SFG强度与探测的几何形状和所研究系统的属性有关,例如二阶磁化率的垂直平方chi((2))vertical bar(2)。除非进行了进一步的假设,否则常规SFG强度测量无法访问chi((2))的复杂部分。因此,很难(有时甚至是不可能)为SFG强度光谱建立独特的拟合解决方案。最近,干涉相敏感SFG或外差检测方法已被引入以实验方式测量chi((2))的实部和虚部。在这里,我们证明了从最大熵方法分析中检索到的复杂光谱与强度SFG光谱拟合(iMEMfit)之间的迭代相位匹配为chi((2))的复杂部分提供了唯一的解决方案,并实现了SFG强度的定量分析光谱。通过iMEMfit提取的应用于强度光谱的复杂零件与相位敏感的实验数据之间的比较表明,这两种方法之间具有极好的一致性。 (C)2015 AIP Publishing LLC。

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