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Thermal resistance at an interface between a crystal and its melt

机译:晶体与其熔体之间的界面处的热阻

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Non-equilibrium molecular dynamics simulations are used to determine interfacial thermal resistance (Kapitza resistance) between a crystal and its melt for three materials including Ar, H_2O, and C_8H_(18) (octane). The simulation results show that the Kapitza resistance at a crystal-melt interface is very small and thus has a negligible effect on thermal transport across the crystal-melt interface. The underlying origins of this behavior are the very good vibrational property match between the two materials forming the interface and good interfacial bonding. The result also indicates that the commonly-used assumption that temperature profile is continuous at the crystal-melt interface is valid even in the case of very rapid crystal melting or growth.
机译:非平衡分子动力学模拟用于确定三种材料(包括Ar,H_2O和C_8H_(18)(辛烷))在晶体及其熔体之间的界面热阻(Kapitza电阻)。仿真结果表明,在晶体-熔体界面处的Kapitza电阻非常小,因此对通过晶体-熔体界面的热传输的影响可忽略不计。此行为的根本原因是形成界面的两种材料之间的良好振动特性匹配以及良好的界面粘合。该结果还表明,即使在非常快的晶体熔化或生长的情况下,通常的假设是温度曲线在晶体-熔体界面处连续也是正确的。

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