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The size of neutral free clusters as manifested in the relative bulk-to-surface intensity in core level photoelectron spectroscopy

机译:中性自由簇的大小,在核心能级电子光谱中从相对于表面的相对强度中得以体现

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摘要

A new approach for obtaining an estimate of the effective size of the free neutral clusters is proposed.The approach relies on an experimental measure of the surfce and interior or "bulk" cluster atoms provided by the x-ray photoelectron spectroscopy and on a model for the attenuation of photoelectrons ejected from the bulk of the cluster as the result of the ionizing irradiaiton.The experimental part gives the ratio of the electron signal from the bulk cluster atoms to that from the cluster surface atoms for a wide range of cluster sizes and electron kinetic energies.The attenuated response of the bulk atoms is modeled using an exponential law with the cluster size and kinetic-energy-dependent electron escape depth as parameters.For the experimental size range,model-based calculations for Ar,Kr,and Xe clusters are presented.The cluster size estimates obtained from comparison of the model calculations and experimental results agree well with those determined from the parameters of the cluster creation process.The combination of experiment and modeling also makes it possible to estimate the effective escape depth for electron propagation in free clusters.For Ar,Kr,and Xe clusters of varying mean size,absolute determination of the surface and bulk electron binding energies of the core levels used in the experiments has also been made.
机译:提出了一种获取自由中性簇的有效尺寸估计值的新方法。该方法依赖于对X射线光电子能谱提供的表面和内部或“大量”簇原子的实验测量,并基于模型实验部分给出了在大范围的团簇尺寸和电子范围内,从团簇原子到团簇表面原子的电子信号与团簇表面原子的电子信号之比。动能:使用指数法则以团簇大小和依赖于动能的电子逸出深度作为参数来模拟本体原子的衰减响应。对于实验尺寸范围,对Ar,Kr和Xe团簇进行基于模型的计算通过模型计算和实验结果的比较得到的聚类大小估计与从样本参数确定的估计吻合良好。实验和建模的结合也使估算自由簇中电子传播的有效逃逸深度成为可能。对于平均尺寸各异的Ar,Kr和Xe簇,表面和体电子结合能的绝对测定实验中所用的核心水平也已经确定。

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