Depinning transition of a driven interface in the random-field Ising model around the upper critical dimension (vol E 66, art no 026127, 2002) - art. no. 069901

摘要

We investigate the depinning transition for driven interfaces in the random-field Ising model for various dimensions. We consider the order parameter as a function of the control parameter (driving field) and examine the effect of thermal fluctuations. Although thermal fluctuations drive the system away from criticality the order parameter obeys a certain scaling law for sufficiently low temperatures and the corresponding exponents are determined. Our results suggest that the so-called upper critical dimension of the depinning transition is five and that the system belongs to the universality class of the quenched Edward-Wilkinson equation. [References: 33]