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首页> 外文期刊>Physical Review, B. Condensed Matter >Compensation mechanism for N acceptors in ZnO - art. no. 085120
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Compensation mechanism for N acceptors in ZnO - art. no. 085120

机译:ZnO中N受体的补偿机理-技术没有。 085120

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摘要

We present a mechanism for the compensation of N acceptors in ZnO through real-space multigrid electronic structure calculations within the local-density-functional approximation. We find that at low N doping levels using a normal N-2 source, O vacancies are the main compensating donors for N acceptors, while N acceptors are compensated via the formation of defect complexes with Zn antisites at high doping levels, When an active plasma N-2 gas is used to increase the N solubility, N acceptors are still greatly compensated by N-2 molecules at oxygen sites and N-acceptor-N-2 complexes, explaining the difficulty in achieving low-resistivity p-type ZnO. [References: 32]
机译:我们提出了一种通过局部密度函数近似内的实空间多网格电子结构计算来补偿ZnO中N受体的机制。我们发现,在使用正常N-2源的低N掺杂水平下,O空位是N受体的主要补偿供体,而当高活性水平时,N受体通过与高掺杂水平的Zn反位点形成缺陷配合物而得到补偿。使用N-2气体来增加N的溶解度,N受体仍被氧位处的N-2分子和N-受体-N-2络合物极大地补偿,这解释了获得低电阻率p型ZnO的困难。 [参考:32]

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