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Inverse problem in the thick-target method of measurements of inner-shell ionization cross sections by electron or positron impact

机译:通过电子或正电子撞击测量内壳电离截面的厚靶方法中的反问题

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摘要

In this paper, the Tikhonov regularization method and the classical molecular dynamics method are used to deal with the inverse problem involved in the measurement of inner-shell ionization cross sections by using the thick-target method. These two methods are applied to simulated and real experimental data for the K-shell ionization of a Ni element by electron impact. The satisfactory results can be obtained by using these two methods to treat the inverse problem involved in the thick-target method. The estimated total error for the method described in this paper is about 10%, which is the same order as the experimental error with the thin-target method. It can be concluded that the thick-target method can be reliably used in the future for the measurement of inner-shell ionization cross sections by electron or positron impact near the threshold energy region.
机译:本文采用Tikhonov正则化方法和经典分子动力学方法来解决使用厚靶法测量内壳电离截面所涉及的反问题。这两种方法被应用于模拟和真实的实验数据,以通过电子撞击使Ni元素的K壳电离。通过使用这两种方法处理厚目标方法中涉及的反问题,可以获得令人满意的结果。本文所述方法的估计总误差约为10%,与稀薄目标方法的实验误差相同。可以得出结论,厚靶方法将来可以可靠地用于通过阈值能量区域附近的电子或正电子冲击来测量内壳电离截面。

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