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Observation of the four-photon de Broglie wavelength by state-projection measurement

机译:通过状态投影测量观察四光子德布罗意波长

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摘要

A measurement process is constructed to project an arbitrary two-mode N-photon state to a maximally entangled N-photon state. The result of this projection measurement shows a typical interference fringe with an N-photon de Broglie wavelength. For an experimental demonstration, this measurement process is applied to a four-photon superposition state from two perpendicularly oriented type-I parametric down-conversion processes. Generalization to the projection measurement of an arbitrary N-photon state can be easily made and may have wide applications in quantum information. As an example, we formulate it for precision phase measurement.
机译:构建测量过程以将任意的两个模式N光子状态投影到最大纠缠的N光子状态。投影测量的结果显示出一个典型的干涉条纹,其条纹具有N光子的德布罗意波长。为了进行实验演示,该测量过程被应用于来自两个垂直取向的I型参数下转换过程的四光子叠加状态。可以容易地对任意N光子状态的投影测量进行一般化,并且可以在量子信息中广泛应用。例如,我们将其公式化为精确的相位测量。

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