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首页> 外文期刊>Physica, C. Superconductivity and its applications >Roughness of a single flux line in type-II superconductor with point-like pins
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Roughness of a single flux line in type-II superconductor with point-like pins

机译:带点状引脚的II类超导体中单条磁通线的粗糙度

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The static and dynamic properties of a single flux line in type-II superconductors with point-like pinning centers are studied by using Langevin dynamics simulations. The roughness W~2 of flux line has a powerlaw relation with line length N along magnetic field, i.e., W~2 ~ N~(2f) with the equilibrium roughness exponent ζ ≈ 0.5 at high temperature and ζ ≈ 0.6 at low temperature. Moreover, the creep motion of single flux line is simulated and the creep formula is checked.
机译:通过使用Langevin动力学仿真研究了具有点状钉扎中心的II型超导体中单条磁通线的静态和动态特性。通量线的粗糙度W〜2与沿磁场的线长N具有幂律关系,即W〜2〜N〜(2f)在高温下平衡粗糙度指数ζ≈0.5,在低温下ζ≈0.6。此外,模拟了单通量线的蠕变运动并检查了蠕变公式。

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