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Ab initio study of the EFG tensor at Cd impurities in Sc2O3 semiconductor

机译:Sc2O3半导体中Cd杂质时EFG张量的从头算研究

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摘要

We present an ab initio study of diluted Cd impurities localized at both cation sites of the semiconductor Sc2O3. The electric-field-gradient (EFG) tensor at Cd impurities located at both cationic sites of the host structure was determined from the calculation of the electronic structure of the doped system. Calculations were performed with the full-potential augmented-plane wave plus local orbitals (APW+lo) method within the framework of the density functional theory. We studied the atomic structural relaxations and the perturbation of the electronic charge density induced by the impurities in the host system in a fully self-consistent way. We showed that the Cd impurity introduces an increase of 8% in the nearest oxygen neighbors bond-lengths, changing the EFG sign for probes located at the asymmetric cation site. The APW+lo predictions for the charged state of the Cd impurity were compared with EFG results existent in the literature, coming from time-differential gamma-gamma perturbed-angular-correlations experiments performed on Cd-111-implanted Sc2O3 powder samples. From the excellent agreement between theory and experiment, we can strongly suggest that the Cd acceptor impurities are ionized at room temperature. Finally, we showed that simple calculations like those performed within the point-charge model with antishielding factors do not correctly describe the problem of a Cd impurity in Sc2O3.
机译:我们提出了从头开始研究位于半导体Sc2O3的两个阳离子部位的稀释Cd杂质的方法。通过计算掺杂系统的电子结构,可以确定位于主体结构两个阳离子位点处的Cd杂质处的电场梯度(EFG)张量。在密度泛函理论的框架内,使用全势增强平面波加局部轨道(APW + lo)方法进行了计算。我们以完全自洽的方式研究了由主体系统中的杂质引起的原子结构弛豫和电子电荷密度的扰动。我们表明,Cd杂质在最近的氧邻域键长中引入了8%的增加,从而改变了位于不对称阳离子位点的探针的EFG标志。将Cd杂质带电状态的APW + lo预测与文献中存在的EFG结果进行了比较,该结果来自对植入Cd-111的Sc2O3粉末样品进行的时差伽马-伽马扰动角相关实验。从理论和实验之间的极好的一致性,我们可以强烈建议Cd受体杂质在室温下被电离。最后,我们表明,简单的计算(如在具有抗屏蔽因子的点电荷模型中执行的计算)无法正确描述Sc2O3中Cd杂质的问题。

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