Widefield microscopy with infinite depth of field and enhanced lateral resolution based on an image inverting interferometer

摘要

We present an interferometric method to gain a theoretically infinite depth of field. Simultaneously, this technique yields an enhanced lateral resolution. This can be achieved by measuring the complex coherence function using an image inverting interferometer. A mathematical explanation of our proposal is given and first experimental results, demonstrating the depth of field as well as the enhanced lateral resolution, are presented. (C) 2014 Elsevier B.V. All rights reserved.