Frustrated Total Internal Reflection: Resonant and Negative Goos-Hanchen Shifts in Microwave Regime

摘要

It is well-known that the variations of Goos-Hanchen shifts (GHSs) are closely associated with the energy flux provided by evanescent states in the case of total internal reflection. However, when the frustrated total internal reflection (FTIR) is realized with double-prism system operated in the microwave frequency, we observe that the GHSs for the reflected beam show periodic, resembling the phenomenon for transmitted beams reported in the literatures, versus either the operating frequency or the air layer thickness, which is different from the variation of the corresponding reflected energy. Moreover, in another FTIR based system fabricated by a composite absorptive material slab with a two-dimensional top layer of frequency selective surface (FSS), the GHSs for reflected beam are discovered as not only resonant but also negative with the incidence of transverse electric that is TE polarized, just as predicted theoretically in the literatures.