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Low-voltage electro-optical memory device based on NiO nanorods dispersed in a ferroelectric liquid crystal

机译:基于分散在铁电液晶中的NiO纳米棒的低压电光存储器件

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摘要

We present a low voltage driven electro-optical memory device fabricated by dispersing nano-sized nickel oxide (nNiO) composed of short length nanorods into a ferroelectric liquid crystal (FLC) host material. The nNiO/FLC composite showed a tremendous decrease in saturation voltage compared to the pristine FLC material along with non-volatile memory behavior which is confirmed through dielectric spectroscopy, polarized optical microscopy and electro-optical response methods. This drop off in saturation voltage is due to the fast alignment of dipolar nNiO and mesogens in the nNiO/FLC composite along the direction of the applied electric field and reduced screening effect. The non-volatile memory behavior of the composite is attributed to the reduction in the depolarization field by adsorption of impurity ions onto the surface of nNiO, which is verified through dielectric spectroscopy and electrical conductivity measurements. These studies pave the way for fabricating non-volatile, low power electro-optical memory devices for advanced information storage applications.
机译:我们提出了一种低压驱动的电光存储器件,该器件通过将由短长度的纳米棒组成的纳米级氧化镍(nNiO)分散到铁电液晶(FLC)主体材料中制成。与原始FLC材料相比,nNiO / FLC复合材料的饱和电压显着降低,并且具有非易失性存储特性,这已通过电介质光谱法,偏振光学显微镜法和电光响应方法得到了证实。饱和电压的这种下降是由于nNiO / FLC复合材料中的偶极nNiO和液晶元沿着所施加电场的方向快速排列而导致的屏蔽效果降低。复合材料的非易失性存储行为归因于杂质离子吸附到nNiO表面上引起的去极化场的减小,这已通过介电谱和电导率测量得到了验证。这些研究为制造用于高级信息存储应用的非易失性,低功耗电光存储设备铺平了道路。

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