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Morphology and composition of oxidized InAs nanowires studied by combined Raman spectroscopy and transmission electron microscopy

机译:结合拉曼光谱和透射电子显微镜研究的氧化InAs纳米线的形貌和组成

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importance for semiconductor nanowires because of the high surface-to-volume ratio and only little is known about the consequences of oxidation for these systems. Here, we study the properties of indium arsenide nanowires which were locally oxidized using a focused laser beam. Polarization dependent micro-Raman measurements confirmed the presence of crystalline arsenic, and transmission electron microscopy diffraction showed the presence of indium oxide. The surface dependence of the oxidation was investigated in branched nanowires grown along the [0001] and [01 (1) over bar0] wurtzite crystal directions exhibiting different surface facets. The oxidation did not occur at the [ 011 (1) over bar 0] direction. The origin of this selectivity is discussed in terms transition state kinetics of the free surfaces of the different crystal families of the facets and numerical simulations of the laser induced heating.
机译:由于高的表面体积比,对半导体纳米线的重要性非常大,而对于这些系统氧化的后果知之甚少。在这里,我们研究了使用聚焦激光束局部氧化的砷化铟纳米线的特性。偏振相关的微拉曼测量结果证实了结晶砷的存在,而透射电子显微镜衍射表明存在氧化铟。在沿bar0001纤锌矿晶体方向沿[0001]和[01(1)生长的分支纳米线中研究了氧化的表面依赖性,所述纤锌矿晶体方向具有不同的表面刻面。在[011(1)超过条形0]方向上未发生氧化。选择性的起源是通过刻面的不同晶体族的自由表面的过渡态动力学和激光感应加热的数值模拟来讨论的。

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