True Surface Topography and Nanomechanical Mapping Measurements on Block Copolymers with Atomic Force Microscopy

摘要

Block copolymers (BCPs) have attracted increased interest in recent years. The highly ordered nanostructures formed by self-assembly can be found in a wide range of promising applications.1-6 To date, most of the studies on BCP nanostructures have been done using smallangle X-ray scattering (SAXS) and electron microscopy with proper staining techniques.7 However, each of these techniques has limitations. The radiation and staining of electron microscopy may damage and change the delicate structure of these BCPs, while neither SAXS nor electron microscopy techniques can be used to determine mechanical information on such materials. In order to understand and develop advanced BCP materials, there is great importance to investigate these samples for identifying phase separated topography, composition, and mechanical properties of individual blocks.