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首页> 外文期刊>Electrochimica Acta >Defect-induced Catalysis toward the Oxygen Reduction Reaction in Single-walled Carbon Nanotube: Nitrogen doped and Non-nitrogen doped
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Defect-induced Catalysis toward the Oxygen Reduction Reaction in Single-walled Carbon Nanotube: Nitrogen doped and Non-nitrogen doped

机译:缺陷诱导的单壁碳纳米管中氧还原反应的催化:氮掺杂和非氮掺杂

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摘要

Single-walled carbon nanotubes (SWNTs) are post-treated by argon (Ar) or ammonia (NH3) plasma irradiation to introduce defects that are potentially related to catalysis towards the oxygen reduction reaction (ORR). Electrochemical characterization in alkali medium suggests that the plasma irradiated SWNTs demonstrate enhanced catalytic activity toward the ORR with a positively shifted threshold potential. Moreover the enhanced desired four-electron pathway catalytic activity, which exhibited as the positive shifted threshold potential, is independent of the nitrogen dopant. The nature of the defects is probed with Raman and X-ray photoelectron spectroscopy. The results indicate that the non-nitrogen doped defects of SWNTs contribute to the actual active site for the ORR. (C) 2016 Elsevier Ltd. All rights reserved.
机译:单壁碳纳米管(SWNT)通过氩(Ar)或氨(NH3)等离子辐射进行后处理,以引入可能与催化氧还原反应(ORR)相关的缺陷。在碱性介质中的电化学表征表明,等离子体辐照的单壁碳纳米管显示出对ORR具有增强的催化活性,且阈值电位正向移动。此外,增强的所需四电子途径催化活性表现为正移阈值电势,与氮掺杂剂无关。缺陷的性质用拉曼和X射线光电子能谱探测。结果表明,SWNT的非氮掺杂缺陷有助于ORR的实际活性位点。 (C)2016 Elsevier Ltd.保留所有权利。

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