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Combined high resolution Scanning Kelvin probe-Scanning electrochemical microscopy investigations for the visualization of local corrosion processes

机译:高分辨率扫描开尔文探针-扫描电化学显微镜相结合,用于可视化局部腐蚀过程

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摘要

An integrated SKP-SECM system was successfully optimised with respect to improved lateral resolution. An aluminum alloy was synthesised by solidification of a liquid melt of pure Al, Cu and Mg metal powders in order to visualize single S-phase intermetallic particles (IMPs) using a newly proposed "glass free" SKP-SECM tip. The obtained IMPs were randomly distributed in the solid solution matrix of the alloy and their average chemical composition was in agreement with that of S-phase IMPs in commercially available AA2024-T351 alloys. The S-phase IMPs were localized in the SKP mode of the SKP-SECM system. The increased electrochemical activity of the S-phase IMPs was visualized using the feedback mode of SECM and the in situ consumption of O_2 on the surface of a single S-phase IMP was visualized in the redoxcompetition mode of the SECM using the same tip. Thus, the local Volta potential difference obtained in the SKP mode could be overlaid with the local electrochemical activity for O_2 reduction.
机译:集成的SKP-SECM系统已成功优化,以提高横向分辨率。通过凝固纯铝,铜和镁金属粉末的液态熔体来合成铝合金,以便使用新提出的“无玻璃” SKP-SECM尖端可视化单个S相金属间颗粒(IMP)。获得的IMPs随机分布在合金的固溶体基质中,其平均化学组成与市售AA2024-T351合金中S相IMPs的平均化学组成一致。 S相IMP定位在SKP-SECM系统的SKP模式下。使用SECM的反馈模式可以看到S相IMPs的电化学活性的提高,并且使用相同的尖端以SECM的氧化还原竞争模式可以看到单个S相IMP的表面上O_2的原位消耗。因此,在SKP模式下获得的局部伏特电势差可以与用于还原O_2的局部电化学活性重叠。

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