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Simulation of fluorescence enhancement by an AFM tip on a gold particle quenched emitter

机译:通过AFM尖端在金粒子淬灭的发射极上模拟荧光增强

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The local field enhancement in proximity of metallic nanostructures can strongly modify the excitation and emission behaviors for the nearby fluorophore. In this paper, Maxwell's time-dependent curl equations are solved by the finite-difference time-domain method to investigate the electric field enhancement around an atomic-force microscopy (AFM) tip and a Au nanosphere (NS). To lower the background fluorescence signal, we proposed to induce the fluorescence quenching by placing the emitter at an optimized position that is 2 nm away from the Au NS. The AFM tip is thereby moved to the vicinity of the emitter quenched by the Au NS. The fluorescence enhancement factor (FEF) increases rapidly when the tip approaches the Au NS. A maximum FEF of 1500-fold is obtained when their separation is 4 nm. By laterally scanning the tip over the Au NS at a constant height, the full width at half-maximum of fluorescence's signal peak with respect to tip position is around 20 nm. This high sensitivity of the FEF on the relative position of the tip and Au NS provides valuable information to guide future experiments on high-resolution optical imaging and fluorescence enhancement for high quantum yield emitters. (C) 2016 Optical Society of America
机译:金属纳米结构附近的局部场增强可以强烈改变附近荧光团的激发和发射行为。本文通过时域有限差分法求解麦克斯韦随时间变化的卷曲方程,以研究原子力显微镜(AFM)尖端和金纳米球(NS)周围的电场增强。为了降低背景荧光信号,我们建议通过将发射器置于距Au NS 2 nm的最佳位置来诱导荧光猝灭。因此,AFM尖端移动到被Au NS淬灭的发射极附近。当尖端接近Au NS时,荧光增强因子(FEF)迅速增加。当它们的间隔为4 nm时,可获得1500倍的最大FEF。通过以恒定的高度在Au NS上横向扫描笔尖,相对于笔尖位置,荧光信号峰值的一半最大处的全宽约为20 nm。 FEF在尖端和Au NS相对位置上的这种高灵敏度提供了有价值的信息,可指导将来针对高量子产率发射体的高分辨率光学成像和荧光增强实验。 (C)2016美国眼镜学会

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