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Deterministic ion beam material adding technology for high-precision optical surfaces

机译:用于高精度光学表面的确定性离子束材料添加技术

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摘要

Although ion beam figuring (IBF) provides a highly deterministic method for the precision figuring of optical components, several problems still need to be addressed, such as the limited correcting capability for mid-to-high spatial frequency surface errors and low machining efficiency for pit defects on surfaces. We propose a figuring method named deterministic ion beam material adding (IBA) technology to solve those problems in IBF. The current deterministic optical figuring mechanism, which is dedicated to removing local protuberances on optical surfaces, is enriched and developed by the IBA technology. Compared with IBF, this method can realize the uniform convergence of surface errors, where the particle transferring effect generated in the IBA process can effectively correct the mid-to-high spatial frequency errors. In addition, IBA can rapidly correct the pit defects on the surface and greatly improve the machining efficiency of the figuring process. The verification experiments are accomplished on our experimental installation to validate the feasibility of the IBA method. First, a fused silica sample with a rectangular pit defect is figured by using IBA. Through two iterations within only 47.5 min, this highly steep pit is effectively corrected, and the surface error is improved from the original 24.69 nm root mean square (RMS) to the final 3.68 nm RMS. Then another experiment is carried out to demonstrate the correcting capability of IBA for mid-to-high spatial frequency surface errors, and the final results indicate that the surface accuracy and surface quality can be simultaneously improved.
机译:尽管离子束刻蚀(IBF)为光学组件的精密刻蚀提供了高度确定性的方法,但仍需要解决一些问题,例如对中高空间频率表面误差的校正能力有限以及凹坑的加工效率低表面缺陷。我们提出一种称为确定性离子束材料添加(IBA)技术的解决方法,以解决IBF中的这些问题。 IBA技术丰富和发展了当前的确定性光学加工机制,该机制专门用于消除光学表面上的局部凸起。与IBF相比,该方法可以实现表面误差的均匀收敛,IBA过程中产生的颗粒转移效应可以有效地校正中高空间频率误差。此外,IBA可以快速纠正表面上的凹坑缺陷,并大大提高了成型过程的加工效率。验证实验是在我们的实验装置上完成的,以验证IBA方法的可行性。首先,使用IBA绘制具有矩形凹坑缺陷的熔融石英样品。通过仅在47.5分钟内进行两次迭代,就可以有效地校正此高度陡峭的凹坑,并将表面误差从最初的24.69 nm均方根(RMS)提高到最终的3.68 nm RMS。然后进行另一项实验,证明IBA对中高空间频率表面误差的校正能力,最终结果表明可以同时提高表面精度和表面质量。

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