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Bright versus dark schlieren imaging: quantitative analysis of quasi-sinusoidal phase objects

机译:明亮与黑暗纹影成像:准正弦相位对象的定量分析

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摘要

We discuss the schlieren imaging of quasi-sinusoidal phase objects. We demonstrate that, when the zero-order (Fourier) spatial component of the input image is not blocked by the schlieren-knife at the Fourier plane, the intensity distribution on the reconstructed image is a linear function of the phase amplitude. In contrast, if the zero order is completely blocked (i.e., dark Schlieren processing), the intensity distribution on the output image becomes essentially a quadratic function of the phase, and thus a direct phase retrieval is not possible. We discuss the possibility of contrast enhancement and present validation experiments.
机译:我们讨论准正弦相位对象的schlieren成像。我们证明,当输入图像的零阶(傅立叶)空间分量未被傅立叶平面上的席纹刀阻挡时,重建图像上的强度分布是相位振幅的线性函数。相反,如果零阶被完全阻止(即,暗Schlieren处理),则输出图像上的强度分布基本上变成相位的二次函数,因此不可能直接进行相位检索。我们讨论了对比度增强的可能性并提出了验证实验。

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