首页> 外文期刊>Applied optics >Two-wavelength phase-shifting interferometry with a superimposed grating displayed on an electrically addressed spatial light modulator
【24h】

Two-wavelength phase-shifting interferometry with a superimposed grating displayed on an electrically addressed spatial light modulator

机译:两波长相移干涉术,在电寻址的空间光调制器上显示叠加的光栅

获取原文
获取原文并翻译 | 示例
           

摘要

A two-wavelength moire phase-shifting interferometer that uses a superimposed grating has been developed. The optical phase shifts for the two wavelengths are given by digital phase shifts of a superimposed grating displayed on a liquid-crystal spatial light modulator. A phase shift of the moire fringe is achieved by equal phase shifts with opposite signs in the two gratings. A moire phase-shifting interferometer with no moving parts and no requirement for calibration of the value of the phase shifts was obtained. Our experimental result shows measurements of the profilc of a step object with a 2.65-μm synthetic wavelength.
机译:已经开发了使用叠加光栅的两波长莫尔相移干涉仪。通过显示在液晶空间光调制器上的叠加光栅的数字相移来给出两个波长的光学相移。莫尔条纹的相移是通过两个光栅中具有相反符号的相等相移实现的。获得了没有移动部件并且不需要校准相移值的莫尔相移干涉仪。我们的实验结果显示了合成波长为2.65μm的台阶物体轮廓的测量结果。

著录项

  • 来源
    《Applied optics》 |2005年第9期|共5页
  • 作者

    Youichi Bitou;

  • 作者单位
  • 收录信息
  • 原文格式 PDF
  • 正文语种 eng
  • 中图分类
  • 关键词

相似文献

  • 外文文献
  • 中文文献
  • 专利
获取原文

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号