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Origins of sp(3)C peaks in C-1s X-ray Photoelectron Spectra of Carbon Materials

机译:碳材料C-1s X射线光电子能谱中sp(3)C峰的起源

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X-ray photoelectron spectroscopy (XPS) is among the most powerful techniques to analyze defective structures of carbon materials such as grapheme and activated carbon. However, reported assignments of defects, especially sp(3)C and sp(2)C, are questionable. Most reports assign sp(3)C peaks to be higher than sp(2)C peaks, whereas a few reports assign sp(3)C peaks to be lower than sp(2)C peaks. Our group previously reported that calculated binding energies of sp(3)C were basically lower than those of sp(2)C. This work clarified that one of the reasons for the prevailing ambiguous assignments of sp(3)C peaks is charging effects of diamond.
机译:X射线光电子能谱(XPS)是分析碳素材料(如石墨烯和活性炭)的缺陷结构的最强大技术之一。但是,报告的缺陷分配,尤其是sp(3)C和sp(2)C值得怀疑。大多数报告将sp(3)C峰指定为高于sp(2)C峰,而少数报告将sp(3)C峰指定为低于sp(2)C峰。我们的小组以前曾报告说,sp(3)C的计算结合能基本上低于sp(2)C的结合能。这项工作阐明了sp(3)C峰普遍存在歧义的原因之一是金刚石的带电效应。

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