首页> 外文期刊>Analytical chemistry >Enhancing Ion Yields in Time-of-Flight-Secondary Ion Mass Spectrometry: A Comparative Study of Argon and Water Cluster Primary Beams
【24h】

Enhancing Ion Yields in Time-of-Flight-Secondary Ion Mass Spectrometry: A Comparative Study of Argon and Water Cluster Primary Beams

机译:飞行时间二次离子质谱分析中提高离子产率:氩和水团簇主电子束的比较研究

获取原文
获取原文并翻译 | 示例
       

摘要

Following from our previous Letter on this topic, this Article reports a detailed study of time-of-flight-secondary ion mass spectrometry (TOF-SIMS) positive ion spectra generated from a set of model biocompounds (arginine, trehalose, DPPC, and angiotensin II) by water cluster primary ion beams in comparison to argon cluster beams over a range of cluster sizes and energies. Sputter yield studies using argon and water beams on arginine and Irganox 1010 have confirmed that the sputter yields using water cluster beams lie on the same universal sputtering curve derived by Seah for argon cluster beams. Thus, increased ion yield using water cluster beams must arise from increased ionization. The spectra and positive ion signals observed using cluster beams in the size range from 1000 to 10 000 and the energy range 5-20 keV are reported. It is confirmed that water cluster beams enhance proton related ionization over against argon beams to a significant degree such that enhanced detection sensitivities from 1 mu m(2) in the region of 100 to 1000 times relative to static SIMS analysis with Ar-2000 cluster beams appear to be accessible. These new studies show that there is an unexpected complexity in the ionization enhancement phenomenon. Whereas optimum ion yields under argon cluster bombardment occur in the region of E >= 10 eV (where E is the beam energy and n the number of argon atoms in the cluster) and fall rapidly when E < 10 eV; for water cluster beams, ion yields increase significantly in this E regime (where n is the number of water molecules in the cluster) and peak for 20 keV beams at a cluster size of 7 000 or E similar to 3 eV. This important result is explored further using D2O cluster beams that confirm that in this low E regime protonation does originate to a large extent from the water molecules. The results, encouraging in themselves, suggest that for both argon and water cluster beams, higher energy beams, e.g., 40 and 80 keV, would enable larger cluster sizes to be exploited with significant benefit for ion yield and hence analytical capability.
机译:在我们之前关于该主题的信函中,本文报道了从一组模型生物化合物(精氨酸,海藻糖,DPPC和血管紧张素)产生的飞行时间二次离子质谱(TOF-SIMS)正离子光谱的详细研究II)在一系列簇尺寸和能量范围内,通过水簇初级离子束与氩簇束的比较。在精氨酸和Irganox 1010上使用氩气和水束进行的溅射产率研究已证实,使用水簇束的溅射产率与Seah得出的关于氩簇束的通用溅射曲线相同。因此,使用水簇束增加的离子产率必须来自增加的电离。报告了使用簇束在1000至10000的范围和5-20 keV的能量范围内观察到的光谱和阳离子信号。可以肯定的是,与使用氩气束束的静态SIMS分析相比,水束束显着增强了与氩气束相比质子相关的电离,从而使检测灵敏度提高了100倍至1000倍之间的1μm(2)。似乎可以访问。这些新的研究表明,电离增强现象出乎意料的复杂性。氩气团簇轰击下的最佳离子产量出现在E / n> = 10 eV的区域(其中E是束能量,n是团簇中的氩原子数),当E / n <10 eV时迅速下降。对于水团簇束,在此E / n方案中离子产量显着增加(其中n是团簇中的水分子数),在20 keV束的团簇大小为7000或E / n接近3 eV时达到峰值。使用D2O簇束进一步探索了这一重要结果,证实了在这种低E / n态下质子化的确在很大程度上源自水分子。结果本身令人鼓舞,表明对于氩和水簇束,更高能量的束,例如40和80keV,将能够利用更大的簇尺寸,这对离子产率和分析能力具有显着的益处。

著录项

相似文献

  • 外文文献
  • 中文文献
  • 专利
获取原文

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号