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首页> 外文期刊>Analytical chemistry >Polarizability of Six-Helix Bundle and Triangle DNA Origami and Their Escape Characteristics from a Dielectrophoretic Trap
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Polarizability of Six-Helix Bundle and Triangle DNA Origami and Their Escape Characteristics from a Dielectrophoretic Trap

机译:六螺旋束和三角形DNA折纸的可极化性及其从介电泳陷阱逃逸的特征

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摘要

DNA nanoassemblies, such as DNA origamis, hold promise in biosensing, drug delivery, nanoelectronic circuits, and biological computing, which require suitable methods for migration and precision positioning. Insulator-based dielectrophoresis (iDEP) has been demonstrated as a powerful migration and trapping tool for mu m- and nm-sized colloids as well as DNA origamis. However, little is known about the polarizability of origami species, which is responsible for their dielectrophoretic migration. Here, we report the experimentally determined polarizabilities of the six-helix bundle origami (6HxB) and triangle origami by measuring the migration times through a potential landscape exhibiting dielectrophoretic barriers. The resulting migration times correlate to the depth of the dielectrophoretic potential barrier and the escape characteristics of the origami according to an adapted Kramer's rate model, allowing their polarizabilities to be determined. We found that the 6HxB polarizability is larger than that of the triangle origami, which correlates with the variations in charge density of both origamis. Further, we discuss the orientation of both origami species in the dielectrophoretic trap and discuss the influence of diffusion during the escape process. Our study provides detailed insight into the factors contributing to the migration through dielectrophoretic potential landscapes, which can be exploited for applications with DNA and other nanoassemblies based on dielectrophoresis.
机译:DNA纳米组件,例如DNA Origamis,在生物传感,药物输送,纳米电子电路和生物计算等领域具有广阔的前景,这需要合适的迁移方法和精确定位。基于绝缘体的介电泳(iDEP)已被证明是用于微米级和纳米级胶体以及DNA Origamis的强大迁移和捕获工具。然而,对于折纸种类的极化性知之甚少,这是它们的介电泳迁移的原因。在这里,我们报告了通过测量迁移时间通过表现出介电屏障的潜在景观,六螺旋束折纸(6HxB)和三角形折纸的实验确定的极化率。根据适应的克莱默速率模型,所得的迁移时间与介电电泳势垒的深度和折纸的逃逸特性相关,从而可以确定其极化率。我们发现6HxB的极化率大于三角形折纸的极化率,这与两个折纸的电荷密度的变化有关。此外,我们讨论了两种折纸物种在介电泳陷阱中的取向,并讨论了逃逸过程中扩散的影响。我们的研究提供了深入了解介电电泳势能迁移的因素的详细见解,这些因素可用于基于介电电泳的DNA和其他纳米组件的应用。

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