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首页> 外文期刊>Analytical chemistry >Application of Nanosecond-UV Laser Ablation-Inductively Coupled Plasma Mass Spectrometry for the Isotopic Analysis of Single Submicrometer-Size Uranium Particles
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Application of Nanosecond-UV Laser Ablation-Inductively Coupled Plasma Mass Spectrometry for the Isotopic Analysis of Single Submicrometer-Size Uranium Particles

机译:纳秒紫外激光烧蚀-电感耦合等离子体质谱法在单个亚微米级铀颗粒同位素分析中的应用

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摘要

For the first time, laser ablation-inductively coupled plasma mass spectrometry (LA-ICPMS) was used to carry out isotopic measurement on single submicrometer-size uranium particles. The analytical procedure was applied on two particle-containing samples already analyzed in the same laboratory by established techniques for particle analysis: combination of the fission track technique with thermo-ionization mass spectrometry (FT-TIMS) and secondary ion mass spectrometry (SIMS). Particles were extracted from their initial matrix with ethanol and deposited on a polycarbonate disk where they were fixed in a layer of an organic compound (collodion). Prior to the isotopic analysis, particles were precisely located on the disk's surface by scanning electron microscopy (SEM) for one sample and using the fission track technique for the other sample. Most of the particles were smaller than 1 (mu)m, and their ~(235)U content was in the femtogram range. ~(235)U/~(238)U ratios were successfully analyzed for all located particles using a nanosecond-UV laser (Cetac LSX 213 nm) coupled to a quadrupole-based ICPMS (Thermo "X-Series II"). LA-ICPMS results, although less precise and accurate (typically 10percent) than the ones obtained by FT-TIMS and SIMS due to short (20-40 s), transient, and noisy signals, are in good agreement with the certified values or with the results obtained with other techniques. Thanks to good measurement efficiency (approx6 X 10~(-4)) and high signaloise ratio during the analysis, LA-ICPMS can be considered a very promising technique for fast particle analysis, provided that uranium-bearing particles are fixed on the sample holder and located prior to isotope measurement.
机译:首次使用激光烧蚀-电感耦合等离子体质谱法(LA-ICPMS)对单个亚微米级铀颗粒进行同位素测量。通过已建立的粒子分析技术,将分析程序应用于已在同一实验室中分析过的两个含粒子样品:裂变径迹技术与热电离质谱(FT-TIMS)和二次离子质谱(SIMS)的结合。用乙醇从其初始基质中提取颗粒,并将其沉积在聚碳酸酯圆盘上,然后将其固定在有机化合物(胶棉)层中。在进行同位素分析之前,通过扫描电子显微镜(SEM)将一个样品精确地定位在磁盘表面上,并将另一样品使用裂变径迹技术将其精确定位在磁盘表面上。大多数颗粒小于1μm,其〜(235)U含量在飞克范围内。使用纳秒级紫外激光(Cetac LSX 213 nm)和基于四极杆的ICPMS(Thermo“ X-Series II”)成功地分析了所有定位粒子的〜(235)U /〜(238)U比。 LA-ICPMS结果虽然由于短(20-40 s),瞬态和噪声信号而比FT-TIMS和SIMS获得的结果精确度和准确性较低(通常为10%),但与认证值或与用其他技术获得的结果。由于分析过程中良好的测量效率(大约6 X 10〜(-4))和高信噪比,如果将含铀颗粒固定在分析仪上,则LA-ICPMS被认为是一种非常有希望的快速颗粒分析技术。样品架,位于同位素测量之前。

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