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Local Feedback Mode of Scanning Electrochemical Microscopy for Electrochemical Characterization of One-Dimensional Nanostructure: Theory and Experiment with Nanoband Electrode as Model Substrate

机译:扫描电化学显微镜用于一维纳米结构电化学表征的局部反馈模式:以纳米带电极为模型基底的理论与实验

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Local feedback mode is introduced as a novel operation mode of scanning electrochemical microscopy (SECM) for electrochemical characterization of a single one-dimensional (1D) nanostructure, for example, a wire, rod, band, and tube with 1-100-nm width and micrometer to centimeter length. To demonstrate the principle, SECM feedback effects under diffusion limitation were studied theoretically and experimentally with a disk probe brought near a semi-infinitely long band electrode as a geometrical model for a conductive 1D nanostructure. As the band becomes narrower than the disk diameter, the feedback mechanism for tip current enhancement is predicted to change from standard positive feedback mode, to positive local feedback mode, and then to negative local feedback mode. The negative local feedback effect is the only feedback effect that allows observation of a 1D nanostructure without serious limitations due to small lateral dimension, available tip size, or finite electron-transfer rate. In line-scan and approach-curve experiments, an unbiased Pt band electrode with 100-nm width and 2.6-cm length was detectable in negative local feedback mode, even using a 25-(mu)m-diameter disk Pt electrode. Using a 2-(mu)m-diameter probe, both well-defined and defected sites were observed in SECM imaging on the basis of local electrochemical activity of the nanoband electrode. Noncontact and spatially resolved measurement is an advantage of this novel SECM approach over standard electrochemical approaches using electrodes based on 1D nanostructure.
机译:引入局部反馈模式作为扫描电化学显微镜(SECM)的一种新颖操作模式,用于电化学表征单个一维(1D)纳米结构,例如宽度为1-100 nm的线,棒,带和管和微米到厘米的长度。为了证明该原理,在圆盘探针附近的半无限长带电极附近作为导电一维纳米结构的几何模型,对在扩散限制下的SECM反馈效应进行了理论和实验研究。当带变得比磁盘直径更窄时,用于尖端电流增强的反馈机制预计将从标准正反馈模式变为正局部反馈模式,然后变为负局部反馈模式。负的局部反馈效应是唯一可以观察到一维纳米结构而没有严重限制的反馈效应,这是由于较小的横向尺寸,可用的尖端尺寸或有限的电子传输速率所致。在线扫描和接近曲线实验中,即使使用直径为25μm的圆盘Pt电极,在负局部反馈模式下也可以检测到宽度为100 nm,长度为2.6 cm的无偏Pt带电极。使用直径为2μm的探针,根据纳米带电极的局部电化学活性,在SECM成像中观察到了明确定义的位置和缺陷位置。与基于1D纳米结构的电极的标准电化学方法相比,这种新颖的SECM方法具有非接触式和空间分辨测量的优势。

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