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Imaging plate calibration for hot electron measurement from ultra intense laser plasmas

机译:成像板校准,用于通过超强激光等离子体测量热电子

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摘要

The Imaging Plate [IP] has been used for a detector of electron spectrometers [ESM] at the Institute of laser Engineering. Electrons energies up to 100 MeV are created in ultra-intense laser plasmas interactions [1] [2]. The IP is a two-dimensional radiation sensor and is based on photo stimulated luminescence[PSL] in BaFBr : Eu{sup}2+ [3]. The IP has attractive features such as a high sensitivity (100 times X-ray film) and wide dynamic range (10{sup}5), good linearity while it can be used repeatedly [4]. The ESM with the IP can easily differentiate electrons and X-ray/γ-ray background signals. However the energy response of the IP is known only less than 1.25 MeV [4]. In this study, the IP is calibrated the IP response for electrons (11.5 and 30 MeV) at an incident angle of 0 degree. The response of the IP on the assumption of the case in which the electron obliquely emitted luminescent layer of the IP by the magnetic field deflection in the ESM, was examined. The luminescent layer thickness is 120 μm.
机译:成像板[IP]已用于激光工程学院的电子光谱仪[ESM]的检测器中。在超强激光等离子体相互作用中会产生高达100 MeV的电子能量[1] [2]。 IP是二维辐射传感器,基于BaFBr:Eu {sup} 2+ [3]中的光激发发光[PSL]。 IP具有吸引人的功能,例如高灵敏度(X射线胶片的100倍)和宽动态范围(10 {sup} 5),良好的线性度,同时可以重复使用[4]。具有IP的ESM可以轻松区分电子和X射线/γ射线背景信号。然而,已知IP的能量响应仅小于1.25 MeV [4]。在这项研究中,IP被校准为在0度入射角下电子(11.5和30 MeV)的IP响应。假设在通过ESM中的磁场偏转使电子倾斜发射IP的发光层的情况下,检查了IP的响应。发光层厚度为120μm。

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