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Atomic scale computer aided design for novel semiconductor devices

机译:用于新型半导体器件的原子规模计算机辅助设计

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Conventional simulation tools for microelectronic technological processes will be soon obsolete since the scaling-down of semiconductor devices requires atomic scale design. In this context only the concurrent use of different complementary methodologies can satisfy the demands of accurate and efficient modelling. We have applied a series of approaches to a noteworthy case: the B-type doping of Si. The choice of appropriate methodology depends on the peculiar problem we must address. Statics and migration mechanism are studied by quantum mechanical calculation. These calculations validate semiempirical approaches based on atomic particle-particle potential which are applied to the system evolution simulation. These last methodologies are useful when the kinetic evolution occurring during the processes is characterized by rearrangements in different structural identities. Moreover, using these simulations, we can set the parameters ruling the complex dissolution rates in the models which can be applied to the large system simulation.
机译:由于半导体器件的缩小要求原子级设计,因此用于微电子技术工艺的传统仿真工具将很快过时。在这种情况下,只有同时使用不同的补充方法才能满足准确,高效建模的需求。我们对一个值得注意的情况采用了一系列方法:Si的B型掺杂。适当方法的选择取决于我们必须解决的特殊问题。通过量子力学计算研究了静力学和迁移机理。这些计算验证了基于原子粒子-粒子电势的半经验方法,该方法已应用于系统演化仿真。当过程中发生的动力学演变以不同结构标识的重排为特征时,这些最后的方法将很有用。此外,使用这些模拟,我们可以在模型中设置决定复杂溶出率的参数,这些参数可以应用于大型系统模拟。

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