首页> 外文期刊>電子情報通信学会技術研究報告. 電子デバイス. Electron Devices >Analysis on the Behavior of a Low Voltage Triggered SCR ESD Clamp Circuit in Comparison between the Standard Transmission Line Pulse System and the Very Fast Transmission Line Pulse System
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Analysis on the Behavior of a Low Voltage Triggered SCR ESD Clamp Circuit in Comparison between the Standard Transmission Line Pulse System and the Very Fast Transmission Line Pulse System

机译:在标准传输线脉冲系统和超快速传输线脉冲系统比较中分析低压触发SCR ESD钳位电路的行为

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摘要

We reported the characterization and the behavior of a Low Voltage Triggered SCR (LVTSCR) with vf-TLP (very-fast Transmission Line Pulse) measurements. The vf-TLP measured results showed that the triggering voltage (Vtl) decreased and the second breakdown current (It2) increased in the comparison with the standard 100ns TLP system. A series of experiments proved that it comes from the dV/dt effect and the power-to-failure versus pulse width relationship.
机译:我们报告了使用vf-TLP(超快速传输线脉冲)测量的低压触发SCR(LVTSCR)的特性和行为。 vf-TLP测量结果表明,与标准100ns TLP系统相比,触发电压(Vtl)降低,第二击穿电流(It2)升高。一系列实验证明,这是由dV / dt效应以及功率失效与脉冲宽度的关系引起的。

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