X-Ray Spectral Study of Features of Electronic Structure of Superdefective Metastable SiC-C Substitutional Solid Solution

摘要

The CK_(alpha), SiL_(alpha), and SiK_(beta) x-ray emission spectra of metastable SiC-C sintered at P = 4 GPa and T = 2073 K and standard beta-SiC are studied. As revealed, there is a rather great low-energy widening of CK_(alpha) and the 30 percent-decrease of SiK_(beta) intensity normalized on SiL_(alpha) line under transition from standard beta-SiC to the polycrystalline SiC-C with reduced lattice parameter.