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A Practical System for Measuring Film Thickness by Means of Laser Interference with Laminar-Like Laser

机译:类似于层流激光器的激光干涉测量膜厚的实用系统

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摘要

A practical system for measuring a film thickness based on laser interferometry has been constructed using a laminar-like laser and a CCD camera. The system can measure a film thickness at a measuring frequency of 50 Hz, which enables real-time measurement in practical use. The measurable minimum thickness by means of a blue laser having a wavelength of 405 nm was 2.4 mm, and the maximum thickness was 1.2 mm for a film with a refractive index of 1.4. The measurement error of the film thickness due to the spherical aberration of the cylindrical lens was Dh/h = 2% at maximum, where h expresses film thickness and Dh its error amount.
机译:已经使用层状激光器和CCD相机构造了基于激光干涉法测量膜厚的实用系统。该系统可以以50 Hz的测量频率测量薄膜厚度,从而可以在实际使用中进行实时测量。借助于波长为405nm的蓝色激光可测的最小厚度为2.4mm,对于折射率为1.4的膜,最大厚度为1.2mm。由柱面透镜的球差引起的膜厚的测量误差最大为Dh / h = 2%,其中h表示膜厚,Dh表示其误差量。

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