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>On metrological support of a specific electromagnetic technique used for measurement of metallic material electrical conductivity
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On metrological support of a specific electromagnetic technique used for measurement of metallic material electrical conductivity
The results of studies concerning development of certified reference materials for measurement of specific electrical conductivity (SEC) in a range of 37.7 - 59.4 MS/m are shown. The specimens are used for metrological support to ensure accuracyand uniformity of measurements of SEC by electromagnetic (eddy-current) method.
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机译:显示了有关开发用于在37.7-59.4 MS / m范围内测量比电导率(SEC)的认证参考材料的研究结果。样品用于计量支持,以确保通过电磁(涡流)方法测量SEC的准确性和均匀性。
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