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Measurement of the dc Kerr and electrostrictive phase modulation in silica

机译:二氧化硅中直流Kerr和电致伸缩相调制的测量

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We report, to our knowledge, the first polarization-resolved measurement of the frequency dependence of both the electronic and the electrostrictive contributions to the de Kerr coefficient in silica. At the acoustic resonance the perpendicular polarization phase shift is a factor of 2.3 times greater than in the parallel polarization, confirming the presence of strong electrostriction. We find good agreement between the phase-shift measurements and theoretical models of both the polarization and frequency dependence. The analysis indicates the de Kerr coefficient chi ((3))(1111)(omega; omega, 0, 0) to be 1.9 x 10(-22) m(2)/V-2. From these results the electrostrictive contribution to a poled-silica device near the device acoustic resonance is expected to be r(33,Es) = 28 pm/V, over an order of magnitude greater than the electronic Kerr electro-optic coefficient r(33,Kerr) = 0.2 pm/V. (C) 2001 Optical Society of America OCIS codes: 190.3270, 160.2750, 160.6030, 190.0190, 230.2090. [References: 32]
机译:据我们所知,我们首次对电子和电致伸缩对二氧化硅的德克尔系数的频率依赖性进行了极化分解测量。在声共振时,垂直极化相移是平行极化中的2.3倍,证实存在强电致伸缩。我们在相移测量与偏振和频率相关性的理论模型之间找到了很好的一致性。分析表明de Kerr系数chi((3))(1111)(ω;ω,0,0)为1.9 x 10(-22)m(2)/ V-2。从这些结果来看,在器件声共振附近对极化石英器件的电致伸缩贡献预计为r(33,Es)= 28 pm / V,超过电子克尔电光系数r(33 ,Kerr)= 0.2 pm / V。 (C)2001年美国光学学会OCIS编码:190.3270、160.2750、160.6030、190.0190、230.2090。 [参考:32]

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