An Overview of Charge Particle Detector to Study Energy Loss of Light Ions in Polymer Films

摘要

The energy loss experiment was performed by using Americium (Am-24)1 alpha particle source, which emits He ions (or light ions) of radiating energy 5.486 MeV. We have used the passivated ion-implanted planar Silicon Surface Barrier Detector (SSBD) of resolution 20 KeV in vacuum for 5.5 MeV energy, system resolution better than 30 KeV for Am-241 source. The Alpha Spectrometer constitutes the Multi-Channel Analyzer (MCA-1K) connected with Alpha Ray Spectroscopy Software (ALSS), Power Supply (NIM BIN), Vacuum Pump, Vacuum Gauge and other tackles. Polymer thin films were prepared using the solution casting method and the said thin films were used to measure the energy loss. The ΔE was 9.64 KeV for each channel in the vacuum and the ΔE was 4.005 MeV without vacuum. The nuclear and electronic energy loss (ΔE) of light ions overlapped with each other in the energy range between 6-10 MeV. Further, the range of energy of Helium ions in PMMA increases exponentially with ion energy. The experimental results are in agreement with those yielded with Bohr theoretical calculations and SRIM codes, too.