Dielectric Relaxation in In(Mg0 5Ti0 5)O: Nanoceramic

摘要

The complex perovskite oxide indium magnesium titanate, In(Mg_(1/2)Ti_(1/2))O_3 (IMT) is synthesized by a solid state reaction technique. Impedance spectroscopy is applied to investigate the electrical properties of IMT in a temperature range from 143 to 333 K and in a frequency range from 580 Hz to 1 MHz. The X-ray diffraction of the sample at room temperature (30 deg C) shows monoclinic phase. The average crystalline size of the IMT powder, calculated using Scherrer's equation is ~ 110 nm. An analysis of the dielectric constant of e and loss tangent (tan 5) with frequency is performed assuming a distribution of relaxation times. The frequency-dependent electrical data are analyzed in the framework of conductivity formalism. The frequency dependent conductivity data are fitted to the universal power law. All these formalisms provided for qualitative similarities in the relaxation time.