QUANTITATIVE PHASE ANALYSIS ON A SINGLE CRYSTAL X-RAY DIFFRACTOMETER EQUIPPED WITH A TWO-DIMENSIONAL FLAT DETECTOR

摘要

The work describes the procedure for performing a quantitative powder X-ray diffraction analysis in the Debye-Scherrer scheme on a single crystal diffractometer equipped with a flat two-dimensional detector. Specially prepared mixtures of polycrystalline phases (alpha-Al2O3, Si, alpha-SiO2, and W) with substantially different linear absorption coefficients are analyzed. It is shown that even when crystallites are most prone to preferred orientation, it is possible to perform measurements with an accuracy no worse than traditional 5 wt.%.